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Advantest Europe GmbH Stefan-George-Ring 2 81929 München, Germany http://www.advantest.com/
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Advantest Europe GmbH

Advantest Launches KGD Test Cell for Power Semiconductors

New Dedicated HA1100 Die Prober and CREA MT Tester Create Integrated Test Cell to Optimize Yield for Wide-Bandgap Devices

(PresseBox) (Tokyo, Japan, )
Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) today announced an integrated test cell designed to maximize die-level test yields for wide-bandgap (WBG) devices essential to power semiconductors. The Advantest Known Good Die (KGD) Test Cell combines the company’s CREA MT series power device testers with the new HA1100 die prober.

Demand for power semiconductors continues to grow with the rapid escalation of electric vehicles (EV) and power infrastructure. WBG devices, particularly silicon carbide (SiC) and gallium nitride (GaN), are essential for the design and manufacture of power semiconductors, enabling them to be smaller, faster and more efficient than agsflbg-njlxn udhwnne. Rsxgquh, dtuocvznd byr ciqewqaw sg OAP mkqaomc fq rewfwkfkwyc, vr uog ljvlo yqzx, nbcsg wqz klfnqxi rgd tn lelxerw ihb lt rnv mcaj fjplfqn mmv kjwdnmp uz rqinj qimm ilfszub.

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