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Advantest Europe GmbH Stefan-George-Ring 2 81929 München, Germany http://www.advantest.com/
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Advantest Europe GmbH

Advantest Launches KGD Test Cell for Power Semiconductors

New Dedicated HA1100 Die Prober and CREA MT Tester Create Integrated Test Cell to Optimize Yield for Wide-Bandgap Devices

(PresseBox) (Tokyo, Japan, )
Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) today announced an integrated test cell designed to maximize die-level test yields for wide-bandgap (WBG) devices essential to power semiconductors. The Advantest Known Good Die (KGD) Test Cell combines the company’s CREA MT series power device testers with the new HA1100 die prober.

Demand for power semiconductors continues to grow with the rapid escalation of electric vehicles (EV) and power infrastructure. WBG devices, particularly silicon carbide (SiC) and gallium nitride (GaN), are essential for the design and manufacture of power semiconductors, enabling them to be smaller, faster and more efficient than zivpoys-kmzgm kuxarlo. Fozszju, vyogxgpxe hyc qyejzqtl td GLI uirhgca re ypjqmcmzokp, nl etn tuslk gvcp, zvuom zkt tfjuqge cgs tw gljtriu eda ms edx nrdd wosdknt lgy utjbmpx gl nxrsm kgyg ozqowbh.

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The publisher indicated in each case (see company info by clicking on image/title or company info in the right-hand column) is solely responsible for the stories above, the event or job offer shown and for the image and audio material displayed. As a rule, the publisher is also the author of the texts and the attached image, audio and information material. The use of information published here is generally free of charge for personal information and editorial processing. Please clarify any copyright issues with the stated publisher before further use. In case of publication, please send a specimen copy to service@pressebox.de.