The newest SPECTRO XEPOS features many major advanced upgrades, including:
Improved spectra handling for increased screening method accuracy even for challenging samples emitting complex sample spectra.
Up to 2X shorter measurement times than the previous model at comparable precision levels. Speed can be a decisive advantage for applications with high count rates, and analyses of many kgswlwt bvj bs prwyynuod ug wa jtmncr yj 3 ci 9 pnjrzmr.
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