For many applications, the data transmission rate and vibration resistance of the conventional VME64x technology are no longer adequate. Consequently, solutions based on VITA 46/VPX are targeted especially at aviation and defence technology applications thanks to their inherent shock and vibration resistance. Due to the constantly increasing demand, ELMA has expanded its product range once again. Several models are available, including a new 3 U backplane. A variety of basic systems using three different cooling concepts - convection, conduction and liquid cooling - cover all significant application areas in this category.
Another new product is a test card that enables developers of daughter boards and system integrators to optimise their products without any need for supplementary test equipment. The interactions between the various individual components in the overall system can be tuned in advance in order to ensure reliable operation.
The special backplane plug-and-socket connectors, which are compliant with the VITA 46 specification, already support data transmission rates up to 10 Gbps and thus guarantee a long product life cycle. The connectors employ differential wafer technology to ensure reliable contact between the backplane and the daughter cards. This improves the data transmission characteristics and prevents bending of the pins when the cards are exchanged. This technology enables field exchange while at the same time yielding low maintenance costs.
Another special feature of VPX is the possibility of using a rear transition module with a form factor as low as 3 U. This makes it possible to implement systems, including I/O cards, with space-saving, low-weight constructions.
Another new product from ELMA is the SerDes test module, which enables VPX systems to be optimized without any supplementary test equipment. This is because the number of slots across which the transmitter and receiver cards have to communicate with each other can in fact make a difference in terms of propagation delay behaviour. For example, if the preamplification of the daughter boards is not right - and there are several hundred setpoints for configuring this - the result is transmission errors.
The entire system is slowed down by the need for repeat transmission of these erroneous signals. By contrast, the system can be optimised "slot by slot" with the new test modules. For this purpose, the card to be tested is plugged into its slot in the system, and the test card is plugged into the receiver slot. All of the test criteria are configured and examined directly on the test card, which only has to be connected via a USB port to a computer equipped with an easy-to-use graphic user interface for visualisation and evaluation. Systems that are optimised in this manner guarantee the highest possible performance.
Another new product is a test card that enables developers of daughter boards and system integrators to optimise their products without any need for supplementary test equipment. The interactions between the various individual components in the overall system can be tuned in advance in order to ensure reliable operation.
The special backplane plug-and-socket connectors, which are compliant with the VITA 46 specification, already support data transmission rates up to 10 Gbps and thus guarantee a long product life cycle. The connectors employ differential wafer technology to ensure reliable contact between the backplane and the daughter cards. This improves the data transmission characteristics and prevents bending of the pins when the cards are exchanged. This technology enables field exchange while at the same time yielding low maintenance costs.
Another special feature of VPX is the possibility of using a rear transition module with a form factor as low as 3 U. This makes it possible to implement systems, including I/O cards, with space-saving, low-weight constructions.
Another new product from ELMA is the SerDes test module, which enables VPX systems to be optimized without any supplementary test equipment. This is because the number of slots across which the transmitter and receiver cards have to communicate with each other can in fact make a difference in terms of propagation delay behaviour. For example, if the preamplification of the daughter boards is not right - and there are several hundred setpoints for configuring this - the result is transmission errors.
The entire system is slowed down by the need for repeat transmission of these erroneous signals. By contrast, the system can be optimised "slot by slot" with the new test modules. For this purpose, the card to be tested is plugged into its slot in the system, and the test card is plugged into the receiver slot. All of the test criteria are configured and examined directly on the test card, which only has to be connected via a USB port to a computer equipped with an easy-to-use graphic user interface for visualisation and evaluation. Systems that are optimised in this manner guarantee the highest possible performance.
