With the INX 760 from VIAVI, LASER COMPONENTS is offering a groundbreaking new probe microscope – the first that can be used to inspect almost all connector types. Automated processes, intuitive user guidance and a robust exterior allow for maximum efficiency in the installation and maintenance of fiber optic networks.
When inspecting connector end faces, the INX 760 provides reliable results in the shortest possible time without compromising measurement accuracy. It takes less than 10 seconds to analyze all fibers in a 12×1 multifiber connection. With a simplex connector, the entire process is completed in just 5 seconds.
Modern networks often use several different plug types in parallel. The INX 760 is therefore supplied with a set of stainless-steel test probes. The technician on site only needs to replace these tips. Their integrated AutoID function automatically adapts all parameters to the respective plug so that the analysis is quickly available without time-consuming manual configuration.
“Contaminated connector end faces are still the most common cause of network errors,” says Tobias Grebing, product engineer at LASER COMPONENTS. “Fast and efficient analysis is therefore crucial for smooth operation. The VIAVI INX 760 sets new standards on this front.”
Further product information:
Backpanel Microscopes
Manufacturer:
Viavi Solutions
When inspecting connector end faces, the INX 760 provides reliable results in the shortest possible time without compromising measurement accuracy. It takes less than 10 seconds to analyze all fibers in a 12×1 multifiber connection. With a simplex connector, the entire process is completed in just 5 seconds.
Modern networks often use several different plug types in parallel. The INX 760 is therefore supplied with a set of stainless-steel test probes. The technician on site only needs to replace these tips. Their integrated AutoID function automatically adapts all parameters to the respective plug so that the analysis is quickly available without time-consuming manual configuration.
“Contaminated connector end faces are still the most common cause of network errors,” says Tobias Grebing, product engineer at LASER COMPONENTS. “Fast and efficient analysis is therefore crucial for smooth operation. The VIAVI INX 760 sets new standards on this front.”
Further product information:
Backpanel Microscopes
Manufacturer:
Viavi Solutions
