"Another exciting development is our SolarModule EL-quickline HR. In this product we have combined the speed of the quickline series with the high resolution of the EL-inline family. With this system we can capture EL-images of a 6x12 solar panel with a resolution of 180µm per pixel within 6 seconds, including fully automatic defect detection," explains Dr. Michael Fuß, CEO of MBJ Solutions GmbH. For the customer this leads to a cycle time of 20 seconds and allows the integration of additional testing procedures.
Furthermore MBJ can offer various new options. Beside known options like barcode reader, automatic 2D cell measurement and software for the repair area now new options for testing the bypass diodes, a hipot test and the detection of hotspots can be integrated into the EL inspection systems from MBJ.
Also new is an optimized and improved defect detection software.