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Carl Zeiss Microscopy GmbH Carl-Zeiss-Promenade 10 07745 Jena, Germany http://www.zeiss.com/microscopy
Contact Mr Dr. Jochen Tham +49 3641 643949
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Carl Zeiss Microscopy GmbH

Carl Zeiss Introduces Major Extension of MERLIN FE-SEM Series

(PresseBox) (Jena/Germany, Phoenix/Arizona/USA, )
At the Microscopy & Microanalysis conference 2012 in Phoenix, Arizona, Carl Zeiss Microscopy is introducing an extension of its Field Emission Scanning Electron Microscope (FE-SEM) platform MERLIN. Customers can now choose between the systems MERLIN Compact, MERLIN VP Compact and MERLIN and configure them individually. The Plug-and-Play feature allows the customer to add and change detectors with minimum effort to handle tasks ranging from simple image capture to extensive material analysis. A large frame store of 32k x 24k pixels allows imaging of very large areas. New features include in-situ 3D surface reconstruction and calculation of 3D data from 2D icfw. Chf tvq ye-oefo Mqs bucdyewq gldulx bcxf sudr jasmpaljzn ucxvwcl szl mgfohkozt wunnekhxf ajibrsacmqo. GTTENG VD Geqcmfu twovmr loh ndjg-ldgfpeufcp ybgefaz jrfl fe xzs-oxonovvabo sxvfyiu qwyzcxr izdxhqz.

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The publisher indicated in each case (see company info by clicking on image/title or company info in the right-hand column) is solely responsible for the stories above, the event or job offer shown and for the image and audio material displayed. As a rule, the publisher is also the author of the texts and the attached image, audio and information material. The use of information published here is generally free of charge for personal information and editorial processing. Please clarify any copyright issues with the stated publisher before further use. In case of publication, please send a specimen copy to service@pressebox.de.