Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, will broadcast a free, web-based seminar titled "Non-Volatile Memory - Characterization and Measurement Techniques" on Thursday, November 17, 2011. To register for this one-hour seminar, visit http://www.keithley.info/NonVolatileMemory.
Efforts to develop alternative non-volatile memory (NVM) technologies to floating gate NAND flash memory are currently underway, such as phase-change memory (PCM/PRAM), ferro-electric memory (FeRAM), magneto-resistive memory (MRAM), and resistive memory (ReRAM). Advanced characterization capabilities are critical to the success of any new technology. Despite the variety of memory technologies now in development, all of them share the need
Efforts to develop alternative non-volatile memory (NVM) technologies to floating gate NAND flash memory are currently underway, such as phase-change memory (PCM/PRAM), ferro-electric memory (FeRAM), magneto-resistive memory (MRAM), and resistive memory (ReRAM). Advanced characterization capabilities are critical to the success of any new technology. Despite the variety of memory technologies now in development, all of them share the need
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