Seica will be showcasing all of the very latest and best in its highly successful range of innovative solutions for electronic testing and selective soldering.
The first showcased test system is the AERIAL M4 Flying Probe. With its innovative, vertical, and compact architecture, this system introduces a new dimension in fixtureless test; both from the viewpoint of minimizing floor space requirements but also due to the extremely fast and stable double-side probing. Existing double-side flying probe systems today experience speed performance issues due to the natural oscillation of a horizontally mounted UUT; because of Aerial s unique architecture this oscillation is virtually eliminated.
With many years of experience in providing market-leading flying probe test systems, the Aerial series (comprised of two models, the Aerial M2 and Aerial M4) is based on Seica s proprietary VIVA Integrated Platform (VIP) which provides a full range of test techniques and automatic programming tools. This abundant range of techniques and tools enable the user to have a full coverage test program ready to run in a short amount of time with minimum effort and without requiring highly specialized personnel. This, along with a very competitive entry price, makes the Aerial an optimum test choice in terms of cost of ownership and maximum productivity.
Another highlight in this year s booth is aimed at manufacturers interested in functional test. Seica has developed a series of turn-key solutions based on the Strategy line of test systems. The solution on display, the Strategy.DT, specifically addresses the test requirements for products in the consumer and automotive markets.
Seica will also showcase it's innovative PILOT VIP Flying Probe system, a full-performance test system that integrates a complete set of test tools and techniques that go beyond the conventional definition of "flying prober". It is another product in Seica's portfolio of automated test solutions, and includes a SMEMA conveyor, which is completely user-programmable to suit various manufacturing and test process layouts.
The system includes the hardware and software features of Seica's unique VIVA Integrated Platform, and can be fully loaded to cover the full range of in-circuit and functional tests, as well as providing additional capabilities such as AOI Inspection, Boundary-scan and On-board programming.