GLACIER-123 is the latest addition to UFI's GLACIER® family of reflectometers. GLACIER® allows to measure losses of optical coatings down to 5 ppm (up to 99.9995% reflectivity) using the extremely sensitive cavity-ringdown spectroscopy method. Designed as a multiwavelength system, GLACIER-123 is the first of its kind to measure at 355 nm. It includes a microchip laser that emits 1064, 532 and 355 nm radiation, making it particularly interesting for those in need of 1064 harmonics wavelengths.
The device can be individually optimized for your application: adding a 4th diode-laser-based wavelength, adapted to fit different sample dimensions, etc. GLACIER-123, together with the original GLACIER and GLACIER-C, are the perfect tools to characterize and optimize your coatings with high accuracy.
The device can be individually optimized for your application: adding a 4th diode-laser-based wavelength, adapted to fit different sample dimensions, etc. GLACIER-123, together with the original GLACIER and GLACIER-C, are the perfect tools to characterize and optimize your coatings with high accuracy.
